MicroLED technology is being used in applications such as microdisplays for augmented reality (AR) and optical interconnects for artificial intelligence data center architectures. These devices can incorporate anywhere from hundreds of thousands to millions of individual emitters, which necessitates verifying their characteristics during the manufacturing process.
Optical laboratory instruments allow this type of characterization to be performed during the research and development phases. Large-scale manufacturing, however, requires systems capable of carrying out the measurements with the performance and automation levels typical of production lines.
The Iris 100 incorporates a spectrometer and a high-resolution camera to measure the spectral response of microLED arrays, as well as the luminance and uniformity of each pixel. According to specifications provided by Teradyne, the system uses test parallelization techniques and image processing algorithms to analyze arrays made up of millions of microLEDs.
The platform uses Teradyne's IG-XL software and allows for the detection of optical defects during the manufacturing process, including inactive or blocked pixels and defects that affect groups of pixels.
The system also has a calibration process traceable to the United States National Institute of Standards and Technology (NIST), designed to facilitate the comparison of measurements between different batches, wafers and manufacturing plants.
Iris 100 can be used both during wafer testing and in final device testing. Its integration with UltraFLEXplus allows microLED testing to be incorporated into installations already using this testing platform.
This launch follows Teradyne's recent initiatives in the field of optical testing. The company previously introduced Photon 100, a solution for testing silicon photonics and copacked optics, and in 2025 announced the acquisition of Quantifi Photonics, a company specializing in photonic testing systems.
Teradyne is also considering expanding Iris 100 to incorporate photodetector testing capabilities on the same platform.
