The new features are geared towards RF systems requiring multiport measurements, MIMO configurations, multiple synchronized channels, and modulated signal analysis within the PXI platform. The NI PXIe-5633 expands the platform's vector network analysis capabilities to four ports.
This configuration allows for the characterization of devices with multiple RF paths and multiport S-parameter measurements. A four-port VNA enables the direct analysis of a greater number of input-output relationships than a two-port instrument, which is particularly relevant for components and subsystems with multiple signal paths.
The press release, however, does not provide specifications for the PXIe-5633 such as frequency range, dynamic range, output power, trace noise, measurement speed or stability, so it is not possible to quantitatively assess its performance.
The second new product is the NI PXIe-5860, a vector signal transceiver for which NI has incorporated software enhancements related to synchronization. These features are aimed at MIMO, multi-channel, and timing-sensitive applications where multiple RF signals must be generated, acquired, or analyzed in a coordinated manner.
The goal is to use multiple channels within a synchronized test architecture to characterize wireless systems based on multiple antennas and RF paths. The information provided does not quantify the synchronization accuracy or specify the mechanisms used to synchronize multiple PXIe-5860 transceivers.
One of the platform's key features is the ability to combine S-parameter characterization with measurements on modulated RF signals.
According to NI, both types of measurements can be performed using a single RF connection within the test system.
Integrating the VNA and VST into a software-controlled PXI architecture allows for the consolidation of different measurement tasks within a single system. This approach can reduce the need for separate configurations for each test class, although the press release does not provide figures on the reduction in the number of instruments, testing time, or system cost.
Both the PXIe-5633 and PXIe-5860 are integrated into the modular PXI platform, allowing different instruments to be combined within the same test architecture.
NI focuses this configuration on automated workflows that can be used from the design validation stages to production environments.
Modularity also allows systems to be configured with varying numbers of channels depending on the requirements of each application.
However, terms in the press release such as "scalable" or "adaptable to future growth" describe the general characteristics of the architecture and do not, in themselves, constitute performance metrics for the new instruments.
The company is targeting these tools at semiconductor validation applications, wireless communications research, and aerospace and defense systems, as well as other RF equipment based on multi-antenna and multi-channel architectures.
