With the advent of DDR4 memory technology, dynamic random access memory (DRAM) data rates can reach up to 3.2 gigatransfers per second. Because of these high speeds, polling memory signals presents a significant challenge for engineers designing high-speed memory systems. Keysight's new DDR4 BGA probe interpolator provides direct access to DRAM cells with minimal load and impact on signal integrity, enabling engineers to accurately measure DDR4 signals.
Keysight's DDR4 BGA probe interposers provide access points to the clock, pulse, data, address, and command signals of the DDR4 DRAM, enabling real-world homologation testing using an oscilloscope.
“High-speed memory designers need reliable access to DRAM cell signals to perform accurate measurements,” said Dave Cipriani, Vice President and General Manager of Keysight’s Oscilloscopes and Protocols Division. “Combined with the InfiniiSim waveform transformation toolset, the new DDR4 BGA probe interpolators offer the most accurate signal representation on the device to accelerate and simplify design validation.”.
“In accordance with the JEDEC standard, we successfully passed the homologation test of our DDR4 memory solution for UltraScale devices operating at 2,400 Mbps (a first in the market) with Keysight’s new x16 DDR4 intercalator,” explained Tamara Schmitz, Director of Power and Memory Technical Marketing at Xilinx.
The DDR4 BGA probe interposers support various packages. The N2114A x4/x8 BGA probe interposer supports x4 and x8 DRAM packages. The N2115A x16 BGA probe interposer supports x16 DRAM packages. Both models can be connected to oscilloscopes that incorporate high-bandwidth InfiniiMax II/III soldering probes.
