The AF013x Hyperlux series offers high-precision long-distance measurements and 3D imaging of fast-moving objects using ON Semiconductor's patented new global shutter pixel architecture and integrated storage. Featuring a 1/3.2" optical form factor CMOS sensor with back-illuminated sensors (BSI) for depth measurement and imaging, these sensors enable on-chip dual laser controllers with modulation frequencies up to 200 MHz and laser eye-safe threshold monitoring.
The AF0130 iToF image sensor features a depth-processing ASIC stacked beneath the pixel area, which calculates depth, confidence, and intensity maps at high speed from its laser-modulated exposures. The AF0130 Hyperlux sensor can capture an entire scene and simultaneously process depth measurement in real time. Additionally, the AF013x sensor family generates monochrome images and depth information simultaneously, providing a complete view of the environment without the need for separate sensors for visual and depth data. The AF0131 is geared toward designs with off-chip depth calculation. The AF0130CSSM30SMKAH3-GEVK and AGBENECS-GEVK evaluation boards from onsemi, available at mouser.com, support the development of applications based on the AF013x sensors.
