This comprehensive, expert-written application guide explains in more detail the critical role of reed relays in semiconductor testing, particularly during wafer probe testing. The guide provides information on using reed relays in semiconductor ATE applications, including the top five reasons why, according to Pickering, reed relays are the ideal switching technology for semiconductor testing.
After semiconductor wafers are manufactured, but before they are sliced into chips that will be packaged into components, they undergo wafer probe testing. These critical electrical and functional tests are performed using wafer probe machines, a type of automated test equipment (ATE) used to verify the functionality of individual chips, whether they are relatively simple structures like diodes and transistors, or more complex integrated circuits (ICs) such as processors, microcontrollers, memories, and analog-to-digital converters (ADCs). These tests help identify any defects early, confirm functionality, and ensure chip quality before they are packaged and used in electronic devices, thus contributing to improved performance.
The probes move around the wafer to connect with the surface pads of individual chips and apply the test conditions (e.g., voltages, currents, or waveforms) supplied by the ATE, as well as to measure voltage levels, current flow, or output waveforms, for example, that the ATE needs to record. Semiconductor testing methods include parametric DC testing (at different current and voltage levels) and parametric AC testing (at different frequencies), both to ensure that the device meets the required specifications, and functional testing to ensure that it operates as intended. For power semiconductor devices, high voltages need to be applied and recorded, and for high-frequency/radio-frequency (HF/RF) devices, appropriate waveforms need to be applied and recorded.
“All of this means that the ATE must be able to apply a variety of test conditions,” explains Robert King, product manager for foil relays at Pickering Electronics. “However, probe stations typically have only a few probes (two is quite common), so the ATE must be able to switch between multiple test conditions and route test results to the appropriate signal conditioning circuits, and this is where foil relays, as controllable switching devices, prove their invaluable worth. Pickering’s application guide explains the top five reasons why foil relays are the ideal switching technology for semiconductor testing.”
Download today's free guide to learn from Pickering's experts on selecting the right relay technologies for your specific needs, and discover why Reed relays are the ideal switching technology for semiconductor testing.
Pickering reed relays are renowned for their reliability, thanks to superior manufacturing processes and quality control. They feature instrument-grade powdered ruthenium contacts, rather than the more common electroplated rhodium associated with lower-quality reed relays, which have less stable contact resistance. Combined with Pickering's coilless construction, this maximizes magnetic efficiency, allowing the use of less sensitive reed switches. This results in optimal switching action and extended service life under harsh operating conditions. Mu-metal magnetic shielding eliminates problems that would arise from magnetic interaction when relays are stacked in close proximity. Learn more about the 10 key advantages of using Pickering relays over other typical relays in the industry.
