with a resolution of 6.5 digits and a maximum acquisition rate of 100,000 points/s. It offers output capabilities of up to ±210 V DC, ±3.03 A DC and ±10.5 A in pulse mode, with a measurement/programming resolution of 10 fA/100 nV.
Integrated Functions:
Four-quadrant operation support, enabling simultaneous closed-loop source and measurement operations for comprehensive device-under-test (DUT) testing.
High-precision pulse simulation mode with current pulses up to ±10.5 A and a minimum width of 50 µs, ideal for characterizing transient conditions in high-power semiconductors such as GaN and SiC.
Linear, logarithmic, and pulse sweeps facilitate rapid IV curve extraction and behavior analysis of diodes, transistors, and other semiconductor components.
User-defined sequences with a minimum time resolution of 10 µs for complex stimulus profiles or multi-segment testing.
Data visualization and analysis via Graphic, Roll, and Measurement view modes, providing a multidimensional perspective of the results.
Efficient programming and remote control, compatible with SCPI commands and USB and LAN connections, as well as control via an integrated web interface or TCP/IP communication for integration into automated test systems.
The SMM3000X series is designed to meet the demanding testing needs of next-generation semiconductors, advanced optoelectronic devices, emerging materials, new energy batteries, and high-density integrated circuits.
