Barcelona (October 19)
Zaragoza (October 21)
Valencia (October 24)
Madrid (October 26):
Bilbao (November 16):
This seminar will present the fundamentals of designing and solving the most common Electromagnetic Compatibility problems using scanners and near-field measurement tools.
This is an eminently practical seminar and very useful for those who wish to refresh the most important concepts in some of the most common challenges in EMC, while discovering a series of tools with great potential when it comes to analyzing and optimizing a specific design.
The seminar will be given by Arturo Mediano, PhD in Industrial Engineering and Professor at the University of Zaragoza and member of the Power Electronics and Microelectronics Group (GEPM) of the University Institute of Engineering Research of Aragon at the University of Zaragoza.
The seminar agenda will be as follows:
Schedule Presentation
08:30 – 09:00 Registration
09:00 – 09:15 Welcome and Presentation
09:15 – 10:45 Review of EMI/EMC Fundamentals
• EMI/EMC: Sources and Victims
• Two Problems: Emission and Immunity
• Electric and Magnetic Fields in Electronic Circuits
• Why Do We Have EMI/EMC Problems?
• The big secret: controlling the current
• Discover the NEAR and FAR fields
10:45 – 11:30 Tools for design and diagnostics
• Near-field probes and accessories
• Near-field scanners
• Spatial and spectral scanner
11:30 – 12:00 Coffee break
12:00 – 13:00 Real-world cases and demonstrations
• Scanner in various real-world designs
• Demonstrations with FieldFox and EMSCAN
• Example: ferrites, cable, decoupling, and filtering
13:00 – 14:00 Presentation of the measurement solutions used and questions
Registration for this seminar is free and the number of places is limited.
You can register through the website, by calling 800 000 154, or if you prefer, send a message with your contact details to
